Description
The Bruker Dimension Icon is a high-performance atomic force microscope (AFM) designed for materials research and nanoscale characterization. Featuring a closed-loop XY scanner with sub-angstrom noise floor, it supports contact, tapping, PeakForce QNM, and conductive AFM modes. Its 210 mm motorized sample stage accommodates large specimens including full wafers, making it a versatile platform for polymer, semiconductor, and thin-film analysis at the nanometer scale.
Specifications
| Scan Range Xy Um | 90 |
|---|---|
| Scan Range Z Um | 10 |
| Noise Floor Z Pm | 30 |
| Scanner Type | closed-loop XY, open-loop Z |
| Sample Size Mm | 210 |
| Motorized Xy Stage | Yes |
| Modes | contact, tapping, PeakForce, conductive_AFM, magnetic_force |
| Peakforce Quantitative | Yes |
| Nanomechanical Mapping | Yes |
| Integrated Optics | Yes |
Imaging Modes
Topography
Peakforce Qnm
Tapping Mode
Contact Mode
Conductive Afm
Typical Specimens
Polymer
Semiconductor
Thin Film
Nanoparticles
Biological Surface