Description
The Hitachi SU9000 is an ultra-high-resolution cold field emission SEM delivering sub-nanometer imaging at 0.4 nm resolution. Equipped with STEM and BF/DF detectors, it bridges the gap between conventional SEM and TEM for advanced nanocharacterization. In-lens SE and BSE detectors provide exceptional surface sensitivity for semiconductor failure analysis, nanomaterial research, and catalysis studies.
Specifications
| Accelerating Voltage Kv | 0.5, 30 |
|---|---|
| Electron Source | Cold FEG |
| Sem Resolution Nm | 0.4 |
| Stem Resolution Nm | 0.34 |
| Magnification Range | 100, 2000000 |
| Detector Types | SE, BSE, TE, STEM-BF, STEM-DF |
| In Lens Design | Yes |
| Eds Capable | Yes |
Imaging Modes
Secondary Electron
Backscattered Electron
Stem In Sem
Eds Mapping
Typical Specimens
Nanomaterials
Catalyst
Carbon Nanotubes
Quantum Dots