The JEM-ARM300F2 (GRAND ARM II) represents JEOL's flagship aberration-corrected TEM/STEM, achieving sub-angstrom resolution at 0.5 Å. Operating at 300 kV with an 80–300 kV accelerating voltage range, it enables atomic-scale imaging and spectroscopy of the most demanding materials. EELS and EDS capabilities provide simultaneous structural and compositional characterization for cutting-edge research in advanced materials and quantum devices.