Description
The JEOL JEM-F200 is a 200 kV multipurpose TEM/STEM featuring a cold field emission gun for high-brightness, high-coherence illumination. Dual EDS detectors provide efficient elemental mapping at atomic resolution. Its compact design integrates STEM-HAADF, ABF, and BF imaging modes, making it a powerful analytical tool for materials science, nanotechnology, and semiconductor process development.
Specifications
| Manufacturer | JEOL |
|---|---|
| Model Name | JEM-F200 |
| Model Number | JEM-F200 |
| Accelerating Voltage Kv | 80, 200 |
| Electron Source | Cold FEG |
| Point Resolution Nm | 0.19 |
| Lattice Resolution Nm | 0.1 |
| Magnification Range | 50, 1500000 |
| Camera Type | CMOS 4k x 4k |
| Stem Capable | Yes |
| Eds Capable | Yes |
| Eels Capable | Yes |
| Specimen Tilt Deg | 35 |
| Column Vacuum Pa | 1e-06 |
Imaging Modes
Bright Field Tem
Dark Field Tem
Stem Haadf
Stem Bf
Diffraction
Typical Specimens
Nanoparticles
Thin Film
Biological Section
Crystal Structure