Description
The JSM-7900F is a high-resolution field emission SEM optimized for advanced analytical applications. With 0.7 nm resolution at 15 kV and comprehensive EDS/WDS/EBSD detector integration, it delivers detailed morphological and compositional data. Its in-lens detector system and gentle beam technology provide superior imaging of beam-sensitive and non-conductive specimens.
Specifications
| Accelerating Voltage Kv | 0.01, 30 |
|---|---|
| Electron Source | Schottky FEG |
| Resolution Nm | 0.5 |
| Magnification Range | 25, 1000000 |
| Detector Types | Upper SE, Upper BSE, Lower SE, Lower BSE, In-lens |
| Gentle Beam Mode | Yes |
| Specimen Size Mm | 200 |
| Ebsd Ready | Yes |
Imaging Modes
Secondary Electron
Backscattered Electron
Gentle Beam
Ebsd
Eds Mapping
Typical Specimens
Nanostructures
Semiconductor
Polymer
Thin Film
Biological Coated