Description
The JEOL JSM-IT800 is a Schottky field emission SEM with 0.5 nm resolution and integrated EDS/WDS/EBSD analytical capabilities. Guideline imaging and automatic SEM functions streamline workflows for both expert and novice users. Its versatile imaging modes and large chamber accommodate diverse specimen types from metallurgical cross-sections to biological preparations.
Specifications
| Accelerating Voltage Kv | 0.01, 30 |
|---|---|
| Electron Source | Schottky FEG |
| Resolution Nm | 0.7 |
| Magnification Range | 5, 1000000 |
| Detector Types | SE, BSE, EDS, In-lens SE |
| Low Vacuum Mode | Yes |
| Specimen Size Mm | 200 |
| Live Analysis | Yes |
| Eds Integrated | Yes |
Imaging Modes
Secondary Electron
Backscattered Electron
Low Vacuum
Eds Mapping
Typical Specimens
Materials
Biological Uncoated
Semiconductor
Fracture Surface