Description
The Talos F200X G2 is a 200 kV analytical S/TEM combining high-resolution imaging with Super-X EDS for fast, quantitative elemental mapping. Four windowless SDD detectors provide nearly 1 srad solid angle for exceptional analytical sensitivity. Its streamlined user interface makes advanced nano-characterization accessible for materials science, catalysis research, and semiconductor process development.
Specifications
| Accelerating Voltage Kv | 20, 200 |
|---|---|
| Electron Source | X-FEG |
| Stem Resolution Nm | 0.12 |
| Tem Resolution Nm | 0.12 |
| Magnification Range | 25, 2050000 |
| Eds Detector | Super-X (4 SDD) |
| Eds Solid Angle Sr | 0.9 |
| Lorentz Lens | Yes |
| Wet Cell Option | Yes |
Imaging Modes
Bright Field Tem
Stem Haadf
Eds Mapping
Eels
Diffraction
Lorentz
Typical Specimens
Nanoparticles
Catalyst
Battery Materials
Alloy
Biological Section