Description
The ZEISS Xradia 520 Versa is a 3D X-ray microscope (XRM) delivering submicron resolution through a two-stage magnification architecture with synchrotron-quality optics. Resolution at Distance (RaaD) technology provides spatial resolution independent of sample size. Applications include battery electrode analysis, rock core imaging, semiconductor packaging inspection, and biological tissue microstructure visualization.
Specifications
| Voltage Range Kv | 30, 160 |
|---|---|
| Max Power W | 10 |
| Source Type | sealed_transmission |
| Detector Type | 2048x2048 CCD with scintillator |
| Spatial Resolution Nm | 700 |
| Minimum Voxel Size Nm | 70 |
| Max Sample Diameter Mm | 300 |
| Max Sample Height Mm | 300 |
| Rotation Range Deg | 360 |
| Geometric Magnification | Yes |
| Optical Magnification | Yes |
| Dual Magnification | Yes |
| Objectives | 0.4x, 4x, 20x, 40x |
| Scout And Zoom | Yes |
| Interior Tomography | Yes |
| Phase Contrast Capable | Yes |
| In Situ Compatible | Yes |
| Filters | None, LE1, LE2, LE3, LE4, LE5, HE1, HE2, … |
| Scan Time Minutes | 5, 1440 |
Imaging Modes
Absorption Contrast
Phase Contrast
Scout And Zoom
Interior Tomography
In Situ 4d
Virtual Cross Section
Typical Specimens
Semiconductor Package
Geological Core
Composite Material
Battery Cell
Bone Scaffold
Polymer Foam
Pcb Inspection