Description
The Xradia 620 Versa advances submicron X-ray imaging with flat panel extension (FPX) for large field-of-view scanning and enhanced throughput. Its 160 kV source and scout-and-zoom workflow allow rapid identification of regions of interest followed by high-resolution imaging. It serves advanced materials characterization, geological exploration, and composite failure analysis.
Specifications
| Voltage Range Kv | 30, 160 |
|---|---|
| Max Power W | 10 |
| Source Type | sealed_transmission |
| Detector Type | flat_panel_detector |
| Detector Pixels | 4000x4000 |
| Spatial Resolution Nm | 500 |
| Minimum Voxel Size Nm | 40 |
| Max Sample Diameter Mm | 300 |
| Max Sample Height Mm | 300 |
| Rotation Range Deg | 360 |
| Geometric Magnification | Yes |
| Optical Magnification | Yes |
| Objectives | 0.4x, 4x, 20x, 40x |
| Flat Panel Extension | Yes |
| Wide Field Of View | Yes |
| Deep Scan Capability | Yes |
| Scout And Zoom | Yes |
| Interior Tomography | Yes |
| Phase Contrast Capable | Yes |
| In Situ Compatible | Yes |
| Automated Filter Changer | Yes |
| Filters | None, LE1, LE2, LE3, LE4, LE5, HE1, HE2, … |
Imaging Modes
Absorption Contrast
Phase Contrast
Scout And Zoom
Interior Tomography
In Situ 4d
Wide Field Scan
Deep Scan
Virtual Cross Section
Typical Specimens
Semiconductor Package
Battery Cell
Composite Material
Geological Sample
Biological Tissue
Metal Additive Manufacturing
Electronics