Description
The Xradia 800 Ultra is ZEISS's highest-resolution laboratory X-ray microscope, achieving 50 nm spatial resolution using a Cr X-ray source and Fresnel zone plate optics. It enables non-destructive nanoscale 3D imaging of internal structures that were previously only visible with synchrotron radiation. Key applications include integrated circuit (IC) interconnect inspection, polymer nanocomposite analysis, and biological cell ultrastructure visualization.
Specifications
| Voltage Kv | 5.4 |
|---|---|
| Source Type | rotating_anode_cr_ka |
| Detector Type | high_resolution_CCD |
| Spatial Resolution Nm | 50 |
| Minimum Voxel Size Nm | 16 |
| Max Sample Diameter Um | 65 |
| Optics Type | fresnel_zone_plate |
| Zone Plate Resolution Nm | 50 |
| Field Of View Um | 65 |
| Rotation Range Deg | 360 |
| Phase Contrast Zernike | Yes |
| Absorption Contrast | Yes |
| Filters | None, Zernike |
| Lab Based | Yes |
Imaging Modes
Absorption Contrast
Zernike Phase Contrast
Nano Tomography
Mosaic Tomography
Typical Specimens
Semiconductor Interconnect
Catalyst Nanoparticle
Battery Electrode
Polymer Nanocomposite
Porous Membrane