Semiconductor Wafer Surface

Materials Science

All Specimens

Silicon wafer cross-section showing transistor gate structures

Stains: unstained

Images: 3

Compatible Scopes: 16

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3 images

Silicon Wafer Cross-Section — Deep Reactive Ion Etch (Bosch Process)

SEM cross-section of a silicon wafer showing deep reactive ion etched (DRIE) structures created by the Bosch process. The high-aspect-ratio trenches with characteristic scalloped sidewalls demonstrate precision semiconductor fabrication at the micrometer scale.

unstained Downloaded 2026-03-16

Sem

2000× Secondary Electron Focus 0.5

SEM cross-section — Bosch process DRIE silicon etching

Wikimedia Commons — CC BY-SA 3.0

Integrated Circuit Die — STM32 ARM Cortex-M3 SEM Overview

Scanning electron microscope image of an STM32F103VGT6 ARM Cortex-M3 microcontroller die showing the full IC layout including memory arrays, logic blocks, peripheral circuits, and bond pads. Manufactured on 90nm CMOS process.

unstained Downloaded 2026-03-16

Sem

100× Secondary Electron Focus 0.5

Full die SEM overview — STM32 ARM microcontroller IC layout

Wikimedia Commons — CC BY-SA 3.0

Semiconductor Die — Carbon Nanotube FET Fabrication

SEM image of a semiconductor die designed for carbon nanotube field-effect transistor (CNTFET) fabrication. Shows lithographically patterned electrode structures, contact pads, and nanoscale channel regions on the wafer surface.

unstained Downloaded 2026-03-16

Sem

500× Secondary Electron Focus 0.5

SEM — CNTFET fabrication die with electrode patterning

Wikimedia Commons — CC BY-SA 3.0

Compatible Microscopes

Model	Manufacturer	Type	Magnification Range	NA Max	Resolution
Dimension Icon	Bruker	Afm	-–-×	—	— nm
MultiMode 8	Bruker	Spm	-–-×	—	— nm
SkyScan 1275	Bruker	Micro Ct	-–-×	—	— nm
SkyScan 1273	Bruker	Micro Ct	-–-×	—	— nm
HT7800	Hitachi High-Tech	Tem	200–600000×	—	— nm
Regulus 8200	Hitachi High-Tech	Fe Sem	20–2000000×	—	0.6 nm
JEM-F200	JEOL	Tem	50–1500000×	—	— nm
JSM-IT800	JEOL	Sem	5–1000000×	—	0.7 nm
JSM-7900F	JEOL	Fe Sem	25–1000000×	—	0.5 nm
nano3DX	Rigaku	X Ray Microscope	-–-×	—	— nm
inspeXio SMX-225CT FPD HR Plus	Shimadzu	Micro Ct	-–-×	—	— nm
Apreo 2	Thermo Fisher Scientific	Fe Sem	13–2000000×	—	0.7 nm
Helios 5 UX	Thermo Fisher Scientific	Fib Sem	55–2400000×	—	— nm
Xradia 520 Versa	Zeiss	X Ray Microscope	-–-×	—	— nm
Xradia 620 Versa	Zeiss	X Ray Microscope	-–-×	—	— nm
Xradia 800 Ultra	Zeiss	X Ray Microscope	-–-×	—	— nm

Semiconductor Wafer Surface